PRESENTATION
PIC testing optimization as a crucial step for PIC technology deployment
One of the crucial steps needed for PIC deployment is establishing fast, highly reliable and repeatable testing, that intends to accelerate PIC design cycles and increase yield of known good dies. Among key challenges that PIC testing is facing, is insertion loss sensitivity of surface coupling to launching angle and fiber gap as well as fast and accurate polarization alignment. In collaboration with partners, Keysight developed PIC test solutions covering wide range of applications from R&D to full-fledged production and wide range of measurements from polarization and wavelength resolved optical to up to 110 GHz electro-optical. The latest Keysight developments for highly automated, fast and accurate PIC testing will be presented.
Daria Lavrova
Keysight Technologies
Daria Lavrova joined Keysight in July, 2022 as a Product planner and she is responsible for strategical planning on the next-generation photonics T&M solutions. Prior to joining Keysight Daria had a versatile experience working as a researcher at ITMO University, Russia with a focus on fiber-optic sensing systems and LiNbO3-based modulators and in parallel leading a start-up that commercialized a novel technology of Fiber Bragg Grating sensors interrogation. Daria got her PhD degree in optical measurements science in 2019. Current topics of interest are photonics T&M solutions, PICs and optical communication systems.